Signedon both dials: ABRAMS
FunctionFor measuring the strikes and dips (or the topography) of geologic formations in aerial photographs.
This is how the introduction to the 1945 patent describes this instrument: "In aerial mapping it is customary to take a series of photographs, either vertical or oblique, at definite intervals while the airplane carrying the camera flies on a definite course at a definite elevation. The photographs are taken often enough so that there is a relatively wide overlap of adjacent photographs. It is possible to accurately determine the relative elevations of a number of points on the earth's surface by measuring the parallax of those points in two such overlapping vertical aerial photographs, or two oblique aerial photographs rectified to the vertical, taken in the above manner. Essentially the present invention is a device for accurately measuring the parallax in such photographs and thereby determining elevations of points on the ground, although the invention has a number of other uses such as, for example, interpretation of microscopic and X-ray photographs."